多功能掃描探針顯微鏡（帶納米力學測試功能）型號：NT-206，是集多功能于一身的原子力顯微鏡，帶有復雜的硬件與軟件分析系統，可分析形貌與力學性能，分辨率為納米級別。可添加：納米壓痕、劃痕、磨損，附著力、摩擦力測試，納米光刻等功能。
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| A probe is positioned above journal neck of watch gear |
Embedded videosystem in combination with motorized XY micropositioning stage provide convenient tuning of the instrument and its fine targeting onto the features on the sample surface. All that dramatically enhances the instrument's functionality when researching micro- and nanosize objects.
To meet requirements of specific research tasks, AFM NT-206 can include specialized changeable probe holders for microtribometry and adhesiometry or for nanoindentation.
NT-206 ::: Description ::: Features ::: Delivery set ::: Software
多功能掃描探針顯微鏡（帶納米力學測試功能）技術指標：
Measurement modes: 測量模式：
Motion patterns at the measurements: |
Note. |
Scan field area:掃描面積 | from 5x5 micron up to 50x40 microns |
Maximum range of measured heights:高度范圍 | from 2 to 4 micron |
Lateral resolution (plane XY):側面分辨率 | 1–5 nm (depending on sample hardness) |
Vertical resolution (direction Z):豎直分辨率 | 0.1–0.5 nm (depending on sample hardness) |
Scanning matrix:掃描矩陣 | Up to 1024x1024 points |
Scan rate:掃描速度 | 40–250 points per second in X-Y plane |
Nonlinearity correction :非線性校正 | A software nonlinearity correction provided |
Minimum scanning step:最小掃描步階 | 0.3 nm |
Scanning scheme:掃描步驟 | The sample is moved in X-Y plane (horizontal) and in Z-direction (vertical) under stationary probe. |
Scanner type:掃描器類型 | A piezoceramic tube. |
Cantilevers (probes):懸臂（探針） | Commercial AFM cantilevers of 3.4x1.6x0.4 mm. |
Cantilever deflection detection system:懸臂傾斜探測系統 | Laser beam scheme with four-quadrant position-sensitive photodetector |
Sample size:樣品尺寸 | Up to 30x30x8 mm (w–d–h); extending block insert allows measurement of samples with height up to 35 mm |
High voltage amplifier output: 高壓放大器輸出 | +190 V |
ADC: | 16 bit |
Operation environment:操作環境 | Open air, 760+40 mm Hg col., T = 22+4°С, relative humidity <70% |
Range of automated movement of measuring head:測量頭自動移動范圍 | 10x10 mm in XY plane for micropositioning of probe relative measured sample at step 2.5 micron with optical visual monitoring |
Overall dimensions:總尺寸 | Scanning unit: 185x185x290 mm |
Field of view of embedded videosystem:植入視頻系統的視場 | 1x0.75 mm, visualization window 640x480 pixel, frame rate up to 30 fps. |
Vibration isolation:防震隔離 | Additional antivibration table is recommended |
Host computer:控制計算機 | Not less than: Celeron® 2.2, RAM 256 MB, HDD 80 GB, VRAM 128 MB, monitor 17" 1024x768x32 bit, Windows® XP SP1, 2 USB port. |
Software:軟件 | Special control software SurfaceScan ａnd the AFM image processing package SurfaceView / SurfaceXplorer are included. |
* Before measurements, the probe can be positioned to necessary place over the sample with help of automated motorized stage. To provide monitoring for the scan area and objects below the probe, the instrument embeds a videosystem allowing to watch the probe motion over the sample surface. Videosystem and the motorized stage for the probe positioning over sample are included in base set by default. A combination of these two options allows rather flexible selection of objects to be measured on the sample surface at direct visual monitoring by the opeartor.
多功能掃描探針顯微鏡（帶納米力學測試功能）組成模塊：
DELIVERY SET
NT-206 ::: Description ::: Features ::: Delivery set ::: Software
| ::: BASIC SET | |||
 | Scanning unit (atomic force microscope) Includes a base platform with embedded XY positioning stage and a detachable measuring head with integrated video system | ||
 | Control electronic unit | ||
 | Software package including: The software runs under Win32. Supplied on CD. Updates available at this site in section ARCHIVE > SOFTWAREAFM control software SurfaceScan for driving complex and data acqusition and visualization .SurfaceView and SurfaceXplorersoftware package for the measured data processing, visualization and analysis.The software can include plug-ins for processing AFM-data obtained with other microscopes.A set of drivers for connection of control electronic unit with host PC and running videosystem. | ||
Note: 1 Base set includes also the control software (for Win32) and user manual. 多功能掃描探針顯微鏡（帶納米力學測試功能）可選配件 | |||
| ::: ADDITIONAL ACCESSORIES (optional) | |||
 | A specialized antivibration rack |  | A changeable probe holder |
 | Changeable scaners for ranges: 5x5x2 um 10x10x3 um 20x20x3.5 um 40x40x3.5 um 50x50x3.5 um 90x90x3.5 um |  | Set for scanning the sample emmersed in liquid medium |
 | Thermocell: a changeable sample platform for measured sample heating up to 150 °С with stand-allone controller |  | A changeable holder for conducting probes |
 | Extending block insert allowing measurement of thick samples with height up to 35 mm |  | A changeable microtribometer-adhesiometer unit |
 | Option: a set of AFM probes (Prod. by Mikromasch) |  | A changeable shear-force microtribometer unit |
 | Option: a set of calibration test gratings (Prod. by Mikromasch) |  | A changeable nanoindentor unit |
多功能掃描探針顯微鏡（帶納米力學測試功能）軟件
SOFTWARE
NT-206 ::: Description ::: Features ::: Delivery set ::: Software
Control software for AFM NT-206 SurfaceScan is a 32-bit Windows application.
It runs under Windows XPsp2/Vista/7 operating systems.
The control software provides all preliminary tunings and settings necessary for the AFM operation: visual control over the laser-beam detection system adjustment, tuning of the cantilever oscillations (in dynamic modes), feed-back system adjusting, sample positioning under the probe and sample approach to the probe before measurements and removal after the measurements. A full-field or any reduced area within the full field of the scanner can be selected for measurements.
Operator can watch any combination of acquired AFM/LFM images in data visualization window or switch to look at them in one window. Additionally, profile of currenly acquired line can be monitored as well.
Acquired data are saved in files of special format that can be then processed, visualised (in 2-D and 3-D presentation) and analysed with a specialized software package SurfaceView or SurfaceXplorer.
